STAr Technologies introduces a new integrated test system for MicroLED devices

Taiwan-based STAr Technologies launched a new inspection system for MicroLEDs and mini-LEDs devices. the Unicorn-LAIT is an integrated system with parallel test instrument, probe station and probe cards and can meet mass production needs.

STAr says that its new system enables alignment of up to 6-inch wafers and probe cards for automatic probing test. The parallel test instrument will be based on STAr Taurus-LPX with PMU capable of performing 48 to a maximum of 240 LEDs in parallel. Attributed to the efficient system structure, The STAr Unicorn-LAIT is suitable for the LED industry chip maker and optical devices manufacturer.

Source: MicroLED-Info

View source version on MicroLED-Info: https://www.microled-info.com/star-technologies-introduces-new-integrated-test-system-microled-devices

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