2013-03-20

Fast and easy growth analysis on Patterned Sapphire Substrates (PSS)

In the next years, the use of PSS will further increase due to its high light extraction efficiency. Following this trend, LayTec‘s in-situ metrology software EpiNet 2 can be individually customized for various kinds of PSS. Our users can expand the substrate database by themselves. LayTec‘s Calibration Manual explains how to measure PSS reflectance in different pockets in one single calibration run. If required, LayTec also offers related customer trainings. Once the initial reflectance values of the PSS substrates are uploaded, the operator can choose the needed substrate in the RunType‘s Material Spec window (Fig. 1). As a result, all PSS wafers can be monitored with the same accuracy as standard sapphire substrates.
Continue reading
ams OSRAM, a global leader in innovative light and sensor solutions today held a roundtable forum spotlighting new opportunities with high precision illumination characterization. The event brought together experts from industry, academia, and... READ MORE

ams OSRAM introduces the new generation of the NIGHT BREAKER LED SPEED H7 and the first NIGHT BREAKER LED SPEED H4 which is another milestone in the field of LED retrofit lamps. Both road-approved¹ retrofit solutions carry the addition up... READ MORE