At the SEMICON Taiwan 2010 trade shows and seminars in Taipei, Taiwan next week (SEP 8-10, 2010), Veeco Instruments Inc.  (Nasdaq: VECO), a global provider of precision instrumentation and metrology solutions for scientific and industrial markets, will announce a new ContourGT™ Optical Surface Profiler configuration optimized for characterizing high-brightness light-emitting diode (HB-LED) patterned sapphire substrates (PSS).

Veeco's booth is at hall 1, Booth no. 2830.

The ContourGT-X8 PSS combines advanced non-contact 3D measurement capabilities with unique Veeco PSS metrology hardware and software technology, and a Wafer Automation System Developer’s Kit (SDK) that provides a tailored solution for PSS quality assurance and quality control applications where high-throughput and repeatability capabilities are essential.

About the ContourGT-X8 PSS
The ContourGT-X8 PSS is a special configuration of Veeco’s ContourGT-X8, the flagship of the ContourGT Family, which includes a range of profilers designed to meet the requirements and budgets for every type of production and R&D precision surface metrology application. Sold in conjunction with the ContourtGT-X8 Wafer Automation SDK, it features patent pending PSS metrology hardware and software and TCP/IP-based remote control capabilities. These features, combined with the ContourGT-X8’s patented dual HB-LED illumination and continuous calibration, enable the system to be readily integrated with automated wafer handlers to provide top PSS measurement precision, throughput and gauge repeatability and reproducibility.