2014-05-23

KLA-Tencor: Wafer Defect Detection Inspection Trends

Optic inspection is still the mainstream wafer defect detection method in the inspection and metrology field, while E-beam will continue to be a niche market, said KLA-Tencor Chief Marketing Officer Brian Trafas during the opening ceremony of the new training facility held at the company’s Hsinchu branch on May 23, 2014.
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The CLEDIA project, co-financed by the Auvergne-Rhône-Alpes A group of logos with different names AI-generated content may be incorrect. Region and Bpifrance has just been completed after three years of collaborative innovation between P... READ MORE

Seoul Semiconductor has developed an innovative LED light source—SunLike—that reproduces a spectrum nearly identical to natural sunlight. The technology is gaining attention for its positive effects on eye health, including reducing ... READ MORE