2017-05-02

Programmable Light Source Improves Wafer Level Image Sensor/Detector Testing

A new digitally programmable, color tunable, calibrated light source from Gamma Scientific is a turnkey, drop-in addition to commercially available systems for wafer level testing of CCD and CMOS sensors.  Specifically, the RS-7-4 SpectralLED™ Tunable LED Light Source bolts directly on to existing image sensor testers from manufacturers such as Teradyne and National Instruments, and can also be readily adapted to test head manipulators and handler instrumentation custom built by end users.  
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Veeco Instruments Inc. today announced that PlayNitride, an industry leader in MicroLED technology, has qualified Veeco’s Lumina® MOCVD system for production of next-generation MicroLEDs, and also placed an order for two systems for ... READ MORE