Instrument Systems of the Konica Minolta Group introduces a camera-based measurement solution for Micro LED wafer testing that generates 2-dimensional, pixel-resolved optical analyses within given cycle times. The LumiTop 4000 has a resolution of 12 MP and can detect the smallest of defects and inhomogeneities on the wafer. Thanks to a 100 mm macro lens, the camera enables fast parallel inline analysis of all Micro LEDs on a wafer at a single test station. Micro LEDs are renowned for being an exacting new display technology. According to the latest definition of L...