2013-02-19

Laytec Launches New in-situ GaN LED Monitoring System

Laytec has upgraded in-situ GaN LED monitoring system. LED manufacturers would know the emission wavelength of the final device during MOCVD growth. Today, according to the Solid State Lighting road map, the wavelength variation across a wafer should be less than 1 nm. This means a less than 1 K (10C) variation of the GaN surface temperature during InGaN MQW growth. LayTec’s Pyro 400 is widely used for enabling fab-wide GaN surface temperature uniformity in many LED manufacturers production lines. Meanwhile, more complex LED structur...
Continue reading

Before kickoff, there is silence throughout the stadium. Floodlights illuminate the pitch, every blade of grass precisely trimmed, dense, and vibrantly green. But soon, the turf will endure hours of intense match play — sprints, tackles,... READ MORE

ams OSRAM, global leader in innovative light and sensor solutions, announced today that its OSIRE™ E3731i intelligent RGB LED, based on the Open System Protocol (OSP), has been successfully integrated into the NIO ES9 — NIO’s... READ MORE