2017-05-02

Programmable Light Source Improves Wafer Level Image Sensor/Detector Testing

A new digitally programmable, color tunable, calibrated light source from Gamma Scientific is a turnkey, drop-in addition to commercially available systems for wafer level testing of CCD and CMOS sensors.  Specifically, the RS-7-4 SpectralLED™ Tunable LED Light Source bolts directly on to existing image sensor testers from manufacturers such as Teradyne and National Instruments, and can also be readily adapted to test head manipulators and handler instrumentation custom built by end users.  
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Munich, Germany – Valeo, a global leader in automotive lighting, and Ennostar, a global leader in optoelectronic solutions, are collaborating on smart automotive exterior displays. Their first collaborative product is showcased at IAA Mo... READ MORE

The all-new Mercedes-Benz GLC: the highlights For many years, the GLC has been the most popular model from Mercedes-Benz, repeatedly topping the charts as the brand’s bestseller, worldwide. As was the case once again in the first half of... READ MORE