2014-05-23

KLA-Tencor: Wafer Defect Detection Inspection Trends

Optic inspection is still the mainstream wafer defect detection method in the inspection and metrology field, while E-beam will continue to be a niche market, said KLA-Tencor Chief Marketing Officer Brian Trafas during the opening ceremony of the new training facility held at the company’s Hsinchu branch on May 23, 2014.
Continue reading
2014-05-23

Taiwan Continues to Play Key Role in KLA-Tencor Business Strategy

Global process control and yield management product leader KLA-Tencor’s newly launched Taiwan Training Facility continues to reflect the market’s important role in the company’s business strategy.
Continue reading
2013-08-26

KLA-Tencor: Optical Inspection Won’t Be Replaced by E-beam Anytime Soon

Despite of downpours and strong gusts caused by severe tropical storm Trami that hit Taiwan on Aug. 21, 2013, optical inspection giant KLA-Tencor Corporation outlined its 2013 product plans and business strategy at a press conference in Taipei that day. KLA-Tencor that usually keeps a low profile responded to questions concerning competitor Hermes Microvision Inc. (HMI), a large Taiwanese E-beam inspection equipment manufacturer. KLA-Tencor emphasized, while E-beams have higher resolution than optics, its inspection speed is too slow, and pointed out optical inspection is still the mainstream inspection method on the market. The company also announced it will be establishing equipment training centers in Taiwan, which reflects the aim of KLA-Tencor’s trip to the country to firmly establish its presence.
Continue reading
2013-04-27

KLA-Tencor Announces Novel Defect Discovery and Monitoring Technology

NanoPoint™ enables fast, practical design qualification and highly sensitive process monitoring by leveraging critical patterns KLA-Tencor Corporation (NASDAQ: KLAC) announced NanoPoint™, a new family of patented technologies for its 2900 Series defect inspection system. NanoPoint represents an entirely new way to discover and monitor defects, at optical speed and on existing optical defect inspection equipment. NanoPoint's value has already been demonstrated on early metal layers, where line-edge roughness (LER) on dense pattern had previously l...
Continue reading
2013-04-12

KLA-Tencor Corporation Receives Intel's Preferred Quality Supplier Award

 KLA-Tencor Corporation has been recognized as one of 17 companies receiving Intel Corporation's Preferred Quality Supplier (PQS) award for their performance in 2012. KLA-Tencor Corporation is recognized for their significant contributions providing Intel with process control capital equipment and services, deemed essential to Intel's success.  "KLA-Tencor is honored to receive Intel's Preferred Quality Supplier award for a second consecutive year—a true testament to our employees' expertise and world class inspection and metrology equipment and services," ......
Continue reading
2013-01-31

KLA-Tencor Announces New eS805(TM) Electron-Beam Inspection System

New tool detects electrical issues and small physical defects; helps optimize high-speed optical wafer inspection systems for preferential capture of yield-relevant defects KLA-Tencor Corporation (NASDAQ: KLAC) announced the eS805™, a new electron-beam inspection system for leading-edge chip manufacturers. Benefiting from more than twenty years of KLA-Tencor's e-beam inspection development and manufacturing expertise, the eS805 offers strong capability in detection of very small defects and defects that cause electrical problems in the integrated circuit, ...
Continue reading
2012-06-25

LEDforum 2012 Guangzhou Highlights: The Demands for LED Lighting will keep Increasing

LEDforum 2012 Guangzhou organized by LEDinside and Guangzhou International Lighting Exhibition, as well as co-sponsored by CNLEDW.com ,has grandly opened at the Chinese Export Commodities Fair Pazhou Complex, Area B, Room #8 on June 11, 2012. This LEDforum has invited global LED market leaders from Osram, Philips Lumileds, Seoul Semiconductor, Henkel (China), Lextar, Aixtron, Veeco Instruments, KLA-Tencor and Laytec to give wonderful presentations.   Dr. C.L. Liu from TrendForce Corp. gave an opening speech Louis...
Continue reading
2012-06-13

DOE Announces $7 million Investments to Support SSL Development

Recently, according to The U.S. Department of Energy (DOE), it has released more than $7 million for three innovative lighting projects at companies in California, Michigan and North Carolina that aim to lower the cost of manufacturing high-efficiency solid-state lighting (SSL) technologies LEDs and OLEDs.   The two-year projects selected will focus on significantly reducing manufacturing costs while continuing to improve the quality and performance of solid state lighting technologies.  These investments, which will leverage an additional $5 million in p...
Continue reading
2009-12-03

KLA-Tencor Launches ICOS(R) WI-2250 Wafer Inspector

KLA-Tencor Corporation, a supplier of process control and yield management solutions for the semiconductor and related industries, introduced the next addition to its wafer inspection portfolio, the ICOS(R) WI-2250. According to the company, the ICOS WI-2250 offers a dramatic improvement in inspection speed, compared to currently available products, allowing manufacturers to transition to larger LED and MEMS wafer sizes.
Continue reading

Violumas, provider of high-power UV LED solutions and inventor of 3-PAD LED technology, is proud to launch the release of new 275nm and 265nm LEDs in mid-power, high-power, and high-density packages. The radiant flux of the new 275nm and 265nm... READ MORE

DURHAM, NC – November 12, 2024 –– Cree LED, a Penguin Solutions brand (Nasdaq: PENG), today announced the launch of its new CV28D LEDs with FusionBeam™ Technology, a groundbreaking advancement for the LED signage market... READ MORE